Calculated by the Chinese Academy of Sciences researcher Li Xiaowei of VLSI testing and design for testability notes

Packet : 43680518vlsi-test-technology.rar filelist
第4讲2007-10-15.ppt
第5讲2007-10-22.ppt
第6讲2007-10-29.ppt
第7讲2007-11-05.ppt
预讲20070910.ppt
program.pdf
第1讲20070910.ppt
第2讲20070917.ppt
第3讲20070924.ppt

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