Test the circuit diagram of TTL and CMOS electronic device through single chip microcomputer

电路测试设计\ict.JPG
电路测试设计\PCB图 ECO.Log
电路测试设计\PCB图.PCBDOC
电路测试设计\Status Report.Txt
电路测试设计\原理图.SCHDOC
电路测试设计\原理图.xls
电路测试设计\库\Project Outputs for 元件库\元件库\Project Outputs for 元件库\元件库.IntLib
电路测试设计\库\Project Outputs for 元件库\元件库\元件库.LIBPKG
电路测试设计\库\Project Outputs for 元件库\元件库\所用元件.SCHLIB
电路测试设计\库\Project Outputs for 元件库\元件库\所用元件封装.PCBLIB
电路测试设计\库\Project Outputs for 元件库\元件库.IntLib
电路测试设计\库\元件库.LIBPKG
电路测试设计\库\所用元件封装.PCBLIB
电路测试设计\项目.PRJPCB
电路测试设计\库\Project Outputs for 元件库\元件库\Project Outputs for 元件库
电路测试设计\库\Project Outputs for 元件库\元件库
电路测试设计\库\Project Outputs for 元件库
电路测试设计\库
电路测试设计

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