针对常用的图像下采样方法无法满足不同应用需要的问题，提出下采样和插值在实现技术上具有同一性的特点，下采样可以采用插值的大量先进技术。将下采样与插值均看作是对邻域未知像素的预测，建立了统一的像素预测模型。实验结果验证了该同一性的思想，并表明与

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插值与下采样.pdf

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